Rietveld refinement of Debye-Scherrer synchrotron X-ray data from Al2O3 Thompson, P. ; Cox, D. E. ; Hastings, J. B. Abstract Publication: Journal of Applied Crystallography Pub Date: April 1987 DOI: 10.1107/S0021889887087090 Bibcode: 1987JApCr..20...79T