The realization of this long-term vision requires tackling key technical challenges to allow for greater temporal, spectral, coding and spatial resource efficiency. As well, these technologies all rely on high levels of electronic device integration, yielding a radical new connectorless measurement paradigm where “on-wafer-to-over-the-air” measurements are the norm.
The “5G and Beyond” program at NIST is designed to provide the wireless industry with the maximum metrological impact as it develops new technology, standards, and instrumentation. It includes the following projects.
- Millimeter-wave Transistor and NL Device Measurements
- mmWave Transistor Measurements and Models for First-Pass Design
- Acoustic-Wave Filters
- Millimeter-Wave Signal Characterization
- Waveform Traceability
- Source and Transmitter Characterization
- Impedance, Power, Noise
- Channel Measurement and Modeling
- Channel Sounding
- Channel Modeling
- 28, 60, 83 GHz
- Over-the-Air Test for Massive MIMO
- Antenna Meas. Facility
- MIMO Antenna Test
- Free-Field Modulated Signal Test
- Reverb. Chamber Methods
- Radio Resource Allocation and Beamforming Algorithms
- Smart path beam forming based on antenna and channel models
- Beamforming algorithmic platform






