Semiconductor > Products > Microcomputers
Main Contents begins from here.
Based on a rigorous analysis of embedded device software and system needs, the Panasonic AM1 (MN101C/MN101E/MN101L) and AM3 (MN103H/MN103S/ MN103L) Series signal a new concept in microcomputer design. With 8-bit and 32-bit models that share a unified architecture, these microcomputers combine high performance with low power consumption in a package that supports C-language programming for a fast, efficient development cycle. Since the instructions for MN103H/MN103S and MN101C/MN101E are respectively compatible with MN103L's and MN101L's, the programming data can be inherited to achieve efficient system development. They feature a single development environment and are suitable for a wide range of applications, including high-performance embedded controllers and key devices in multimedia hardware.
| 32-bit | 8-bit | ||||
|---|---|---|---|---|---|
| Series | Fast,High Performance MN103H Series |
High Performance MN103S Series |
Low Power MN103L Series |
MN101C Series MN101E Series |
Low Power MN101L Series |
| Maximum Frequency | 120MHz | 60MHz | 40MHz | 20MHz | 10MHz |
| ROM Size | 32Kbyte to 1Mbyte | 32Kbyte to 1Mbyte | 128Kbyte to 1Mbyte | 32Kbyte to 256Kbyte | 16Kbyte to 128Kbyte |
| Applications | Power Control, Inverter Control, etc. |
Inverter Control, System Control, etc. |
System Control, Inverter Control, Automobile Use, etc. |
System Control, Inverter Control, LCD control, Automobile Use, etc. |
Low-Power-Consumption System Controller, etc. |
Panasonic has developed an industry�s first new non-volatile memory ReRAM. The 1T1R-ReRAM memory is fabricated by the CMOS process with 0.18-μm low power consumption ReRAM, enabling readout at low-voltage and fast memory cell rewriting at 10 ns.
Microcomputer with ReRAM reduces power consumption of applications, in particular allowing longer battery life and downsizing for environment infrastructure equipment, such as smart meter, and mobile devices, such as smart phone requiring low power consumption.
ReRAM is a device capable of changing its resistance at intervals of at least 10ns and holding the value, therefore allowing high-speed rewriting.
Furthermore, it can be easily applied to fine process and has a potential leading to large memory capacity.
| Items | ReRAM memory | Flash memory |
|---|---|---|
| Operating principles |
Resistance change by oxidation and reduction |
Charge injection and ejection by high voltage applied |
| Features | 1.Power-saving readout 2.Rewritten in units of bytes 3.High-speed rewriting |
1.Space-saving and large capacity 2.Written in units of bytes, but erased in units of sectors |
In order to control devices in real time, a dedicated extended ALU can be provided to perform a high-speed multiplication/division and multiply-and-accumulate operation. The ALU can decrease the frequency of the system clock to deliver both high performance and low power consumption.
By increasing the frequency of the system clock, you can also use our microcontrollers for power supplies or other advanced control systems.
To achieve a high-accuracy analog function, we have used the know-how cultivated through the analog product development to develop microcontrollers.
The on-chip oscillator, voltage detection circuit, and high-precision operational amplifier allow the number of external parts to be reduced, which leads to the reduction of the system cost.
Provides high-voltage input pins to control batteries and touch panels.
Reduces the number of external parts for high voltage to enable a low-cost high-voltage system.
The data area of Flash memory and ReRAM can be used as an alternative for EEPROM, thus allowing external EEPROMs to be reduced.
The IC, as the center of control in modern electronic equipment, plays a crucial role supporting progress in this equipment. As the functionality provided by the latest electronic equipment continues to advance, even higher integration levels and even higher speeds are required in their ICs. At the same time, the popularity of portable electronic equipment has led to demands for further miniaturization and lower operating voltages. To respond to these needs and demands, IC fabrication processes have moved to ever finer feature sizes, progressing in tandem with other IC developments.
Due to these advances, IC malfunctions due to noise is becoming a significant issue, and inadequate electromagnetic compatibility (EMC: the ability to operate in the presence of noise) is now the focus of much concern.
Since EMC problems largely depend on the PCB design, until now, EMC problems have been seen as an issue for end product design, and workarounds have largely focused on the end product. However, due to the lower voltages and higher speeds of the latest equipment,it has become harder then ever to distinguish between noise and normal signals.
At the same time, the increasing functionality of advanced ICs has made analyses related to EMC more difficult, and this in turn makes workarounds in the end product harder to achieve.
With today's shorter product cycles, the time and effort required to achieve the required EMC at the end product level has become a significant factor, and improved resistance to noise at the independent IC level is becoming increasingly important.
The IC, as the center of control in modern electronic equipment, plays a crucial role supporting progress in this equipment. As the functionality provided by the latest electronic equipment continues to advance, even higher integration levels and even higher speeds are required in their ICs. At the same time, the popularity of portable electronic equipment has led to demands for further miniaturization and lower operating voltages. To respond to these needs and demands, IC fabrication processes have moved to ever finer feature sizes, progressing in tandem with other IC developments.
Due to these advances, IC malfunctions due to noise is becoming a significant issue, and inadequate electromagnetic compatibility (EMC: the ability to operate in the presence of noise) is now the focus of much concern.
Since EMC problems largely depend on the PCB design, until now, EMC problems have been seen as an issue for end product design, and workarounds have largely focused on the end product. However, due to the lower voltages and higher speeds of the latest equipment,it has become harder then ever to distinguish between noise and normal signals.
At the same time, the increasing functionality of advanced ICs has made analyses related to EMC more difficult, and this in turn makes workarounds in the end product harder to achieve.
With today's shorter product cycles, the time and effort required to achieve the required EMC at the end product level has become a significant factor, and improved resistance to noise at the independent IC level is becoming increasingly important.
In Japan, EMC standards for electronic equipment as end products are regulated by a variety of laws covering electromagnetic radiation and consumer products. Radio Low, Electrical Appliance and Material Control Low, or similar laws are in force around the world, such as the IEC regulations on electronic equipment that have been in force in Europe since 1996.
In contrast, EMC standards for electronic device such as ICs are still at the stage where the IEC is working on the standardization of test procedures.
In addition to EMI measurement in conformance with IEC standards, Panasonic is also developing evaluation methods for EMS such as those described below and preparing an environment that will allow independent evaluation of ICs.
Panasonic models the noise entering an IC as being of two types: conductive noise and radiation noise, and aims at standardization with common programs and noise evaluation boards that improve observability to eliminate dependence on the user's mounting boards and software.
The ICs used in electronic equipment are subject to a wide range of noise sources. These include power supply noise, electrostatic noise (ESD), radio noise, and spark noise from high-voltage components in the vicinity. These noise signals enter the end product through power supply lines and the chassis, affect the PCBs the ICs are mounted on, and finally impinge on the ICs. The following phenomena are thought to cause IC malfunctions in this type of environment.
Panasonic has enhanced the noise immunity of the AM microcomputers based on the following points.
Capacitors are placed at critical points in the IC power supply and function blocks in the AM microcomputers. The placement of these capacitors in the IC stabilizes the power supply are and improves the IC's resistance to noise.
Transmission of noise superimposed on input signals to internal circuits is prevented by inserting appropriate noise filters. Furthermore, measures such as adding Schmitt trigger circuits and optimizing input sensitivities have been applied to pins, such as oscillator, reset, and interrupt pins, for which software noise countermeasures are difficult.
These microcomputers feature protection functions for operating mode transitions to prevent operating mode transitions should a software runaway occur.
ICs used in electronic equipment handle digital signals and generate harmonic currents. It is thought that the PCBs, wiring harnesses, and chassis in application systems act as antennas and radiate these high-frequency signals to the surrounding environment. Of these, the supply currents associated with internal logic operation show little attenuation,since these are upper harmonics of a fundamental that is the operating frequency, and as a result can easily cause problems.
The following EMI reduction measures are implemented in the AM microcomputers.
In the AM microcomputer series, bypasses are provided for noise currents by placing capacitors in the IC. This suppresses power supply noise leakage.
Low-voltage operation that achieves both reduced power consumption and reduced EMS in the AM microcomputer series reduces the power of the noise itself.
Power supply currents are calculated using single-chip simulation, and the EMI of the final product is predicted based on waveform analysis. This allows the desired EMI characteristics to be built into the product from the design stage.
Panasonic has achieved a significant improvement in noise immunity over earlier products. Despite progress in process feature sizes, Panasonic has achieved even further improvements in voltage handling capacity, and has assured better noise immunity than provided by earlier improved products, even in low-voltage process devices.
The DC line noise and loop radiation noise test methods were developed by Panasonic, and are based on two models, one for noise transmitted to the IC via conduction and one for noise transmitted to the IC via radiation. To eliminate dependency of the test result on the application program, these tests are standardized with a common program that improves observability and a dedicated noise evaluation board.
EMI measurement test for the MP method
The PanaX EX Series, an on-board debugging and programming environment for our microcontrollers, has not only the execution control, event/brake, and load functions equivalent to the existing in-circuit emulator, but also the quasi-on-the-fly function that minimizes the impact on the execution time (watch function, etc.), thus supporting the real-time debugging.
It also provides various development tools for hardware, such as in-circuit emulator and Flash programmer.
Supports the development in C, and provides the C/C++ compiler that is optimized to achieve the high-level objects efficiency. The DebugFactory Builder, an integrated development environment, provides a compiler and makes you comfortable in debugging.
Panasonic Microcontroller product information is available online or through our sales office.
As for the purchase, our worldwide sales companies are responsible for your support individually.
(such as delivery, last order, custom OEM business, quality, environment, so on)
Semiconductor > Products > Microcomputers
