This webinar shares efficient development validation and debugging techniques. Learn about visual debugging, real-time validation, and collaborative tools, plus hands-on experience with NI InstrumentStudio™ software for optimizing workflows.
As devices get smarter, so do our semiconductor test solutions. Discover how NI can equip your organization with cost-effective software and solutions that scale from the lab to the production floor.
We know that semiconductor technology requirements outpace traditional test coverage approaches. That's why NI prioritizes investments in semiconductor manufacturing software, systems, and automatic test equipment (ATE) that help you build solutions that meet your evolving business needs at every step of the process. With testing support for analog, mixed-signal, 5G, and RF devices, we're uniquely qualified to help you bring new products to market.
Wireless Research, Design, & Prototyping
Wireless Device Validation & Characterization
Mixed-Signal IC Validation & Characterization
Semiconductor Production Test
Power Semiconductor Reliability Test
Wafer & Parametric Test
As 5G matures, development is underway for 6G, which will combine new technologies like the FR3 band, integrated sensing and communications (ISAC or JCAS), and open RAN architectures. Across all these areas, AI will be a core underlaying technology.
Accelerate time to market for RF front ends and connectivity devices with flexible, high-performance instrumentation and software-connected workflows—from first interactive measurements to full automation.
Improve efficiency and accelerate time to market for mixed-signal ICs with modular, scalable instrumentation and software-connected workflows—from first interactive measurements to full automation.
Explore smarter alternatives to traditional semiconductor automated test equipment (ATE) solutions that reduce overall costs and boosts test coverage for advanced RF, mixed-signal, and optoelectronic semiconductor devices in high-volume production.
Power semiconductor technologies are developing rapidly from silicon to wide bandgap—and with them the requirements and standards for testing and qualification. Discover NI’s new dynamic test solutions to ensure reliability.
Shrinking transistor geometries are enabling highly capable and power efficient semiconductor devices. Wafer parametric test solutions need advanced capabilities and options for scaling to high parallelism to accelerate reliability test cycles.
Explore best practices to accelerate product development and enable smart analytics in and beyond the lab.
This webinar shares efficient development validation and debugging techniques. Learn about visual debugging, real-time validation, and collaborative tools, plus hands-on experience with NI InstrumentStudio™ software for optimizing workflows.
Customer Stories
Allegro MicroSystems partners with NI to enhance semiconductor efficiency, embedding innovative test strategies early in design for unmatched quality and speed.
See how Qualcomm cut RF validation time by 30% with a scalable, intelligent test strategy powered by NI PXI RF instruments, NI software, and global collaboration.
As LED chips get smaller, the number of chips per wafer increases to tens of millions. NI’s PXI SMU helped FitTech solve their throughput challenge.
Imec used accurate electrical wafer-level tests in to detect process-related issues at an early stage to manage yield drops, optimize the R&D process flow, reduce costs, and decrease time to market.
NI Services
Maximize productivity and reduce costs with NI services. As your trusted partner and expert connector, we’re here to help you Engineer Ambitiously™.